Carla Dorigoni

Chief Technician


Corso Bettini, 31


Carla Dorigoni received the Laurea degree in Physics from the University of Trento, in Trento, Italy, in 1995, working on thin film deposition by sputtering and studying the mixing induced by ion beam implantation at film-substrate interface with attention to the effect on the adhesion properties. After a period spent at the University of Trento dealing with the same topics, from 1997 to 2000 she was employed at Consorzio C.R.E.O. - Centro Ricerche Elettro Ottiche, in L’Aquila, Italy. She was involved in research activity on materials and in technology development for infrared applications; she worked on thin film deposition by sputtering and on Silicon micromachining. From 2000 to 2008 she was an R&D Engineer at Agilent Technologies and Avago Technologies (formerly Agilent Technologies), in Turin, Italy. She was at first in optical planar glass devices development, dealing mainly with dry etching. Then she was involved in the fabrication of edge emitting lasers, working on the technological process in the different areas of R&D projects, transfer to manufacturing and production as well.

In December 2008 she joined  Istituto Italiano di Tecnologia, in Genova, Italy, where she managed the Clean Room. 

Currently she has a Technologist position at CNCS Center for Neuroscience and Cognitive Systems in Rovereto (TN)

iit Publications

2018 The modeling and synthesis of nanodiamonds by laser ablation of graphite and diamond-like carbon in liquid-confined ambient
2017 The modelling and synthesis of nanodiamonds with laser ablation of graphite and diamond-like carbon in liquid-confined ambient
2016 On the thermodynamic path enabling a room-temperature, laser-assisted graphite to nanodiamond transformation
2012 Electroless deposition dynamics of silver nanoparticles clusters: A diffusion limited aggregation (DLA) approach
2012 Nanoplasmonic structures for biophotonic applications: SERS overview
2012 Tailored Ag nanoparticles/nanoporous superhydrophobic surfaces hybrid devices for the detection of single molecule
1998 Ar+-implantation effects on the interfacial properties of the WC/Ti-6Al-4V system
1998 Depth-profiling via X-Ray photoemission and Auger spectroscopies of N+ implanted tungsten carbides grown on the Ti-6Al-4V alloy
1996 N+-implantation induced enhanced adhesion in WC1-xTi-6Al-4V